Paraxial speckle-based metrology systems with an aperture

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dc.contributor.author Kelly, Damien P.
dc.contributor.author Ward, Jennifer E.
dc.contributor.author Hennelly, Bryan M.
dc.contributor.author Gopinathan, Unnikrishnan
dc.contributor.author O'Neill, Feidhlim T.
dc.contributor.author Sheridan, John T.
dc.date.accessioned 2011-12-02T15:06:13Z
dc.date.available 2011-12-02T15:06:13Z
dc.date.copyright 2006 Optical Society of America en
dc.date.issued 2006-11-01
dc.identifier.citation Journal of the Optical Society of America A en
dc.identifier.issn 1084-7529
dc.identifier.issn 1520-8532
dc.identifier.uri http://hdl.handle.net/10197/3372
dc.description.abstract Digital speckle photography can be used in the analysis of surface motion in combination with an optical linear canonical transform (LCT). Previously [D. P. Kelly et al. Appl. Opt. 44, 2720 (2005)] it has been shown that optical fractional Fourier transforms (OFRTs) can be used to vary the range and sensitivity of speckle-based metrology systems, allowing the measurement of both the magnitude and direction of tilting (rotation) and translation motion simultaneously, provided that the motion is captured in two separate OFRT domains. This requires two bulk optical systems. We extend the OFRT analysis to more general LCT systems with a single limiting aperture. The effect of a limiting aperture in LCT systems is examined in more detail by deriving a generalized Yamaguchi correlation factor. We demonstrate the benefits of using an LCT approach to metrology design. Using this technique, we show that by varying the curvature of the illuminating field, we can effectively change the output domain. From a practical perspective this means that estimation of the motion of a target can be achieved by using one bulk optical system and different illuminating conditions. Experimental results are provided to support our theoretical analysis. en
dc.description.sponsorship Science Foundation Ireland en
dc.description.sponsorship Irish Research Council for Science, Engineering and Technology en
dc.description.sponsorship Other funder en
dc.format.extent 528620 bytes
dc.format.extent 1072 bytes
dc.format.mimetype application/pdf
dc.format.mimetype text/plain
dc.language.iso en en
dc.publisher Optical Society of America en
dc.rights This paper was published in Journal of the Optical Society of America A and is made available as an electronic reprint with the permission of OSA. The paper can be found at the following URL on the OSA website: http://www.opticsinfobase.org/abstract.cfm?URI=josaa-23-11-2861. Systematic or multiple reproduction or distribution to multiple locations via electronic or other means is prohibited and is subject to penalties under law. en
dc.subject.lcsh Speckle en
dc.subject.lcsh Metrology en
dc.subject.lcsh Fourier transform optics en
dc.subject.lcsh Contact transformations en
dc.subject.lcsh Signal processing en
dc.title Paraxial speckle-based metrology systems with an aperture en
dc.type Journal Article en
dc.internal.availability Full text available en
dc.internal.webversions Publisher's version en
dc.internal.webversions http://dx.doi.org/10.1364/JOSAA.23.002861 en
dc.status Not peer reviewed en
dc.identifier.volume 23 en
dc.identifier.issue 11 en
dc.identifier.startpage 2861 en
dc.identifier.endpage 2870 en
dc.identifier.doi 10.1364/JOSAA.23.002861
dc.neeo.contributor Kelly|Damien P.|aut| en
dc.neeo.contributor Ward|Jennifer E.|aut| en
dc.neeo.contributor Hennelly|Bryan M.|aut| en
dc.neeo.contributor Gopinathan|Unnikrishnan|aut| en
dc.neeo.contributor O'Neill|Feidhlim T.|aut| en
dc.neeo.contributor Sheridan|John T.|aut| en
dc.description.othersponsorship Enterprise Ireland en
dc.description.admin pe, la, sp, ke, ab, is - TS 22.11.11 en


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