Localisation of normal faults in multilayer sequences

DSpace/Manakin Repository

Show simple item record

dc.contributor.author Schöpfer, Martin P. J.
dc.contributor.author Childs, Conrad
dc.contributor.author Walsh, John J.
dc.date.accessioned 2011-07-19T16:05:05Z
dc.date.available 2011-07-19T16:05:05Z
dc.date.copyright 2006 Elsevier Ltd. en
dc.date.issued 2006-05
dc.identifier.citation Journal of Structural Geology en
dc.identifier.issn 0191-8141
dc.identifier.uri http://hdl.handle.net/10197/3025
dc.description.abstract Existing conceptual growth models for faults in layered sequences suggest that faults first localise in strong, and brittle, layers and are later linked in weak, and ductile, layers. We use the Discrete Element Method (DEM) for modelling the growth of a normal fault in a brittle/ductile multilayer sequence. The modelling reveals that faults in brittle/ductile sequences at low confining pressure and high strength contrast localise first as Mode I fractures in the brittle layers. Low amplitude monoclinal folding prior to failure is accommodated by ductile flow in the weak layers. The initially vertically segmented fault arrays are later linked via shallow dipping faults in the weak layers. Faults localise, therefore, as geometrically and kinematically coherent arrays of fault segments in which abandoned fault tips or splays are a product of the strain localisation process and do not necessarily indicate linkage of initially isolated faults. The modelling suggests that fault tip lines in layered sequences are more advanced in the strong layers compared to weak layers, where the difference in propagation distance is most likely related to strength and/or ductility contrast. Layer dependent variations in fault propagation rates generate fringed rather than smooth fault tip lines in multilayers. en
dc.description.sponsorship Not applicable en
dc.format.extent 2221482 bytes
dc.format.mimetype application/pdf
dc.language.iso en en
dc.publisher Elsevier en
dc.rights This is the author’s version of a work that was accepted for publication in Journal of Structural Geology. Changes resulting from the publishing process, such as peer review, editing, corrections, structural formatting, and other quality control mechanisms may not be reflected in this document. Changes may have been made to this work since it was submitted for publication. A definitive version was subsequently published in Journal of Structural Geology Volume 28, Issue 5, May 2006, Pages 816-833 DOI#:10.1016/j.jsg.2006.02.003. en
dc.subject Fault growth en
dc.subject Discrete element method en
dc.subject Fault refraction en
dc.subject Fault tip line en
dc.subject Mohr circles en
dc.subject Stress and strain paths en
dc.subject.lcsh Faults (Geology) en
dc.subject.lcsh Geological modeling en
dc.subject.lcsh Strains and stresses en
dc.title Localisation of normal faults in multilayer sequences en
dc.type Journal Article en
dc.internal.availability Full text available en
dc.internal.webversions Publisher's version en
dc.internal.webversions http://dx.doi.org/10.1016/j.jsg.2006.02.003 en
dc.status Peer reviewed en
dc.identifier.volume 28 en
dc.identifier.issue 5 en
dc.identifier.startpage 816 en
dc.identifier.endpage 833 en
dc.identifier.doi 10.1016/j.jsg.2006.02.003
dc.neeo.contributor Schöpfer|Martin P. J.|aut| en
dc.neeo.contributor Childs|Conrad|aut| en
dc.neeo.contributor Walsh|John J.|aut| en
dc.description.othersponsorship Enterprise Ireland en


Files in this item

This item appears in the following Collection(s)

Show simple item record

This item is available under the Attribution-NonCommercial-NoDerivs 3.0 Ireland. No item may be reproduced for commercial purposes. For other possible restrictions on use please refer to the publisher's URL where this is made available, or to notes contained in the item itself. Other terms may apply.

If you are a publisher or author and have copyright concerns for any item, please email research.repository@ucd.ie and the item will be withdrawn immediately. The author or person responsible for depositing the article will be contacted within one business day.

Search Research Repository


Advanced Search

Browse