Browsing by Author "Körner, T. O."

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Interferometric resolution examined by means of electromagnetic theory

Körner, T. O. ; Sheridan, John T. ; Schwider, J. (Optical Society of America, 1995-04-01)

Interferometric methods are widely used in surface metrology. A question that arises is how much information about the surface can be extracted from a given interferogram. For examination of the resolution limit ...